Next Level High Resolution Scanning Tunneling Microscope For Atomic Imaging And Defect Mapping With Precise Tip Distance Control And PID Tuning To Visualize Atoms, Charge Density, And Lattice Defects

High-Resolution STM for Atomic Imaging and Defect Mapping
✔️ Precise tip-distance control, PID tuning, atom visibility(single unit)

This compact scanning tunneling microscope delivers high-resolution surface imaging to visualize atoms, charge density, and lattice defects on conductive samples. It's a complete single-unit system with scanning head and included accessories for teaching labs and research demonstrations.

✅ Range lattice XYZ 7.6pm XY minimum step width, 3pm Z minimum step width
✅ 0100 to 100 000 nA (step width 0.025 nA)
✅ Tunneling current: 10 +/-V (step width of 0.005 V)
✅ 10 mm sample, 90 to 240 V, 50/60 Hz
✅ USB connection and power supply: control unit, installation CD with software measurement and control
✅ Includes scanning head with cable connection, cover with magnifying glass, base vibration attenuator, tools for tip preparation, PtIr wire 0.25 mm, 300 mm, Graphite (HOPG) sample holder, Gold (1,1,1) sample holder, fourth set of sample carriers
✅ Color: Black

💡 What is a scanning tunneling microscope used for in atomic imaging and defect mapping?

This handy instrument helps researchers study conductive surfaces at the atomic scale and map defects in materials.

- precise tip distance control for atom visualization
- PID tuning for stable tunneling current
- visualization of charge density and lattice defects
- handy in teaching and research demonstrations
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